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Gate constraints are a weak assignment tester

Statement

Let C be a Boolean circuit with s input coordinates, of which n≤s are named, and m non-input gates over the basis of Boolean circuits: basis, fan-in, size, and depth. Then there is a binary constraint graph G over the fixed alphabet Σ0={0,1}3 of eight symbols, with the n named input coordinates among its vertices, such that

  • G has M=O(m+s) ordinary edges, all relations being explicit tables of size at most 8×8, and both G and its edge list are produced from the gate list of C by a deterministic algorithm in time polynomial in m+s;
  • G satisfies the completeness and proximity inequalities of Assignment tester and rejection ratio with the instance-dependent bound ρC:=1/M: every accepted input extends to a satisfying labeling, and every input x and auxiliary labeling b satisfy UNSAT⁡x∪b(G)≥ρC δ(x,SAT⁡(C)). The input coordinates are labeled by the two designated symbols 0:=(0,0,0) and 1:=(1,1,1) of Σ0, identified with the bits of the input. As M grows with C, this alone does not give a fixed positive rejection ratio for the map on all circuits.

Facts & Assumptions

Given: a Boolean circuit C with s input coordinates including named coordinates x1,…,xn, m non-input gates (NOT, AND or OR, with fan-in at most two, and the constants 0,1) and a designated output, in the conventions of Boolean circuits: basis, fan-in, size, and depth, and the assignment-tester conventions of Assignment tester and rejection ratio.

[F1]

The wires of C are its s inputs and its m non-input gates; they can be listed in a topological order in which every gate follows its input wires. For any assignment to all s input coordinates, each wire value is determined by preceding wires; C accepts a named-input assignment x exactly when some assignment to the other s−n input coordinates makes its designated output equal 1 (Boolean circuits: basis, fan-in, size, and depth, Circuit satisfiability).

[F2]

A binary constraint graph has a finite nonempty alphabet, one relation Re⊆Σ2 per edge in a fixed endpoint order, loops with two incidences testing Re(a,a), isolated vertices removable without changing the value, and value equal to the fraction of ordinary edges satisfied when there is at least one edge; duplicating every edge preserves the value fraction, and relations are explicit Boolean tables (Constraint graph and labeling value).

[F3]

An assignment tester with alphabet Σ0 and rejection ratio ρ maps a circuit with named inputs to a constraint system containing those input coordinates, such that accepted inputs extend to labelings with unsatisfiability zero and every input x and auxiliary labeling b satisfy UNSAT⁡x∪b≥ρ δ(x,SAT⁡(C)), where δ is the relative Hamming distance to the accepted inputs and equals 1 when SAT⁡(C)=∅ (Assignment tester and rejection ratio).

Proof

technique · constructive
1.1

The gadget. Put Σ0:={0,1}3, with designated symbols 0=(0,0,0) and 1=(1,1,1); the remaining six symbols are auxiliary. Take as vertices the s+m wires of C, listed in a topological order, together with one gate vertex per non-input gate; the wire vertices include the named input coordinates and are the only vertices whose alphabet is restricted to the two designated symbols. For each wire vertex v add one loop edge with relation D:={(s,s):s∈{0,1}}, restricting its label to a designated symbol. Write d(0):=(0,0,0) and d(1):=(1,1,1) for the designated symbols. For a gate g with input wires p,q and output wire r let Tg⊆Σ0 be the set of triples (a,b,z) with z the value of g on the input bits a,b, taking b:=a and p=q for the one-input gate NOT, so that Tg is a four-element table for AND and OR and the two-element table {(a,a,1−a):a∈{0,1}} for NOT; for a constant gate let Tg:={(c,c,c)} and let r be its output wire. Add a loop edge at the gate vertex with relation Dg:={(s,s):s∈Tg}, add edges from the gate vertex to p and to q with relations P1:={((a,b,z),d(a)):(a,b,z)∈Tg} and P2:={((a,b,z),d(b)):(a,b,z)∈Tg}, and add an edge from the gate vertex to r with relation P3:={((a,b,z),d(z)):(a,b,z)∈Tg}; for a constant gate only P3 is added, there being no input wire. Finally add a loop at the output wire with relation {(1,1)}.

F1F2construct
2.1

Size and explicitness. Each wire contributes one loop, each non-constant gate contributes one loop and three projection edges, each constant gate one loop and one projection edge, and the output one further loop; hence M≤(s+m)+4m+1=O(m+s) ordinary edges, and Σ0 is a fixed eight-symbol alphabet with relations of at most 8×8 entries. Every relation is one of the finitely many displayed tables determined by the gate type, so the edge list is written down from the topological gate list in time linear in m+s.

F2step 1.1algebra
2.2

Perfect completeness. If x∈SAT⁡(C), choose an assignment to the other s−n input coordinates witnessing acceptance, and label every wire vertex by its value in the resulting evaluation of C, read as the designated symbol 0 or 1, and label each gate vertex by the triple of the two input values and the output value of that gate. Then every wire label is designated, so the loops with relation D are satisfied; each gate vertex carries a triple of its truth table, so its loop Dg is satisfied; each projection edge is satisfied because the triple's coordinates are exactly the labels of the corresponding wire vertices; and the output loop is satisfied because the output evaluates to 1. Hence UNSAT⁡x∪b(G)=0 for that labeling, the completeness clause of [F3].

F1F3step 1.1algebra
2.3

Soundness. Fix x∈{0,1}X and an arbitrary labeling b of the gate vertices and of the wire vertices other than the named inputs, and suppose all M edges of G are satisfied. Then every wire label is a designated symbol by the loops with relation D. Read the labels of the unnamed input wires as an assignment to the other s−n input coordinates. We show by induction along the topological order that each wire label equals the evaluation of that wire on this full input assignment: the input vertices have these values by construction, and for a gate whose input wires are already correct, its loop forces its label to be a truth-table triple (a,b,z) of that gate, while the projection edges force a and b to be the labels of its input wires and z to be the label of its output wire; hence the output wire of the gate carries the correct evaluated value. The induction terminates at the designated output wire, whose loop forces its label to be 1, so the output evaluates to 1 and C accepts x by [F1]. Therefore if x∉SAT⁡(C) at least one edge is violated under every b, that is UNSAT⁡x∪b(G)≥1/M; and since δ(x,SAT⁡(C))≤1 always, with δ=1 on SAT⁡(C)=∅ by [F3], this gives UNSAT⁡x∪b(G)≥δ(x,SAT⁡(C))/M.

F1F3step 1.1algebra
3.1

Steps 2.1, 2.2 and 2.3 verify the size, explicitness, completeness and instancewise soundness clauses with ρC=1/M, for the constructed graph over Σ0={0,1}3 of arity 2, the input coordinates being the wire vertices of the named inputs labeled by the designated symbols. Since M is unbounded across circuits, this is a weak, size-dependent proximity construction rather than a map with the fixed rejection ratio required by [F3].

F3step 2.1step 2.2step 2.3discharge-construct∎

Remarks

  • Why the alphabet has eight symbols. A gate vertex must carry the two input bits and the output bit so that the projection edges can force the wires; that is the three-coordinate alphabet {0,1}3, and the wire vertices use only the two designated symbols, which is what makes the induction of step 2.3 go through. The six other symbols may legitimately label gate vertices when they belong to that gate's truth table, but no such symbol satisfies a wire loop D, so it cannot fake an input or wire value.
  • The rejection ratio is only inverse-linear. Its ratio 1/M would require O(log⁡M) verified constant-factor amplification steps to reach a fixed rejection ratio; the point of this construction is that its size is linear in the circuit rather than exponential. It is deliberately not the constant-ratio tester; An exponential-size constant-query base assignment tester supplies that one at exponential size. Combining these two testers at polynomial size requires an additional robust input-preserving composition interface.
  • No randomness and no choice. The gadget is a fixed function of the gate list: the topological order is taken from the circuit description, the relations are the five displayed tables, and no vertex, edge or label is selected. In particular the construction uses no choice principle, and the identification of bits with designated symbols is part of the alphabet convention.

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